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Measuring Instrument(gas) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
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Measuring Instrument Product List

1～15 item / All 26 items

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Gas permeability measurement device

Gas permeability measurement device

Gas permeability measurement device

The gas permeability measuring device film, foil, film composite Rezaroido will be used to measure gas permeability of various packaging materials and other materials like Purasuchikkufimuru. The gas transmission rate measurement system solubility coefficient of gas permeation of materials at various temperatures, we measured the diffusion coefficient and permeability. The gas transmission rate measurement system JIS K7126-A, ISO2556, ISO15105-1, ASTM D1434 and other standards.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices

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Organic gas permeability measurement device

Organic gas permeability measurement device

Organic gas permeability measurement device

Organic vapor transmission rate measurement system, measurements of organic vapor transmission, gas transmission rate of organic transmission rate measurement system Organic vapor transmission rate measurement system films, foils, complex films, bottles and other materials like Purasuchikkufimuru sheet, bags, make quantitative measurements of organic vapor transmission rate of the finished product packing box containers.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices

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Underground Water Flow Sound Measurement Device "GAS-04"

Underground Water Flow Sound Measurement Device "GAS-04"

Comfortably monitor underground water flow sounds with a Wireless Sensor! The location of the waterway can be easily detected.

Underground, there are various sounds such as the flow of groundwater, the friction of gravel, the movement of insects, and the sound of the wind. The "GAS-04" is an underground water flow measurement device that can reduce various noises underground through noise-cut filters and volume adjustment, allowing for the extraction of the sound of underground water flow. Due to the nature of underground water flow increasing near water channels, it is expected to be applied in various cases where identifying the location of water channels and the flow of groundwater is a concern. 【Features】 ■ The measured sound can be digitized and imported into a computer ■ Dustproof, operational from -10°C to 50°C ■ Powered by four AA batteries ■ Simple configuration with a pickup sensor, measurement recorder, and earphones *For more details, please refer to the PDF document or feel free to contact us.

  • others

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Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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FastGate Inline CV/IV Measurement Device ECV-2500

FastGate Inline CV/IV Measurement Device ECV-2500

FastGate Inline CV/IV Measurement Device

It is a device that can be used inline because it does not require electrode formation, does not damage the wafer, and leaves no contamination.

  • Other inspection equipment and devices

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High-precision, high-speed X-ray crystal orientation measurement device Omega-Theta

High-precision, high-speed X-ray crystal orientation measurement device Omega-Theta

Corresponds to all single crystals - Flagship X-ray Orientation

●High-speed measurement in just 10 seconds ●High precision measurement <0.003°/<0.03° (1σ) ●Equipped with a sample horizontal goniometer ●Crystal orientation, Φ scan, and rocking curve measurement ●Optional extended optical systems such as monochromators ●Wafer orientation check and mapping

  • Analytical Equipment and Devices

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Reflectance measurement device

Reflectance measurement device

Reflectance measurement device

This is a spectrophotometer that allows for easy measurement of reflectance. It is an integrated unit with a spectrometer, light source, and fiber, enabling simple and instantaneous measurements without the need for complicated settings or optical axis adjustments. With a light source and CCD/InGaAs detector, it enables high-sensitivity and high-speed measurements of 20 to 100 spectra per second over the range of 250nm to 1700nm.

  • Microscope

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Measuring instrument "FLA-200"

Measuring instrument "FLA-200"

Wafer flatness measurement system!

The "FLA-200" is a non-contact flatness and thickness measurement system. It measures the flatness (TTV, BOW, WARP) and thickness of wafer samples. It supports measurements of thickness, TTV, BOW, warp, site flatness, and global flatness (in accordance with ASTM standards), and data output in CSV format is also possible. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Software compatible with 2-D and 3-D mapping display ■ High-precision measurement using a 5mmφ core capacitive probe ■ High-speed measurement of 12,000 points in under 60 seconds *For more details, please contact us or download the catalog.

  • Other measurement and measuring equipment
  • Semiconductors and ICs

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Tabletop X-ray crystal orientation measurement device SDCOM

Tabletop X-ray crystal orientation measurement device SDCOM

Compact and high-performance Smart X-ray Orientation

●High-speed measurement in just 10 seconds ●Top illumination type ●Various optical system options ●Compatible with ingot and wafer inspection ●Measurement orientation adjustment mechanism

  • Analytical Equipment and Devices

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Resistance rate / Sheet resistance measuring instrument [NC-10]

Resistance rate / Sheet resistance measuring instrument [NC-10]

Resistance rate / Sheet resistance measuring instrument [NC-10]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Resistance Rate / Sheet Resistance Meter 【EC-80】

Resistance Rate / Sheet Resistance Meter 【EC-80】

Resistance Rate / Sheet Resistance Measuring Instrument 【EC-80】

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Non-contact mobility measurement device "LEI-1610 Series"

Non-contact mobility measurement device "LEI-1610 Series"

Measurement of various semiconductor carrier transport characteristics is possible! Non-contact mobility measurement using microwave reflection!

For the manufacturing of semiconductor devices, carrier mobility is a very important parameter. The "LEI-1610 Series" is a non-contact mobility measurement device capable of measuring various semiconductor carrier transport characteristics such as mobility, carrier concentration, and sheet resistance. Carrier mobility, sheet resistance, and sheet charge density can be measured non-contact and destructively on Si wafers ranging from 2 inches to a maximum of 8 inches, as well as on compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 ■ Non-contact mobility measurement using microwave reflection ■ Standard measurement device for high-frequency device characteristics ■ High correlation with measurement results from the Hall effect ■ Multi-carrier modeling option *For more details, please refer to the related link page or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Non-contact resistance tester "NC-80MAP"

Non-contact resistance tester "NC-80MAP"

Wide-range non-contact (eddy current method) sheet resistance/resistivity multi-point measuring instrument

The "NC-80MAP" is a resistance measuring device that supports a wide range of measurements using multiple types of non-contact probes. The number and type of probes can be changed according to your requirements. It is also capable of multi-point measurements from an edge of 8mm. Additionally, due to its non-contact eddy current method, measurements can be taken without causing any damage. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Semi-auto type ■ Multi-point measurement system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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