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Measuring Instrument(gas) - List of Manufacturers, Suppliers, Companies and Products | IPROS GMS

Last Updated： Aggregation Period:Jan 28, 2026～Feb 24, 2026
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Measuring Instrument Product List

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Gas permeability measurement device

Gas permeability measurement device

Gas permeability measurement device

The gas permeability measuring device film, foil, film composite Rezaroido will be used to measure gas permeability of various packaging materials and other materials like Purasuchikkufimuru. The gas transmission rate measurement system solubility coefficient of gas permeation of materials at various temperatures, we measured the diffusion coefficient and permeability. The gas transmission rate measurement system JIS K7126-A, ISO2556, ISO15105-1, ASTM D1434 and other standards.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices
  • Measuring Instrument

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Organic gas permeability measurement device

Organic gas permeability measurement device

Organic gas permeability measurement device

Organic vapor transmission rate measurement system, measurements of organic vapor transmission, gas transmission rate of organic transmission rate measurement system Organic vapor transmission rate measurement system films, foils, complex films, bottles and other materials like Purasuchikkufimuru sheet, bags, make quantitative measurements of organic vapor transmission rate of the finished product packing box containers.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices
  • Measuring Instrument

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Methane fermentation experimental device Gas Endeavor [Compatible with livestock nutrition research]

Methane fermentation experimental device Gas Endeavor [Compatible with livestock nutrition research]

It comes with a shaking constant temperature water bath, making it a system suitable for livestock nutrition research.

This state-of-the-art experimental instrument accurately measures gas volumes in a wide range of applications. This analytical tool excels at measuring low gas quantities and low gas flow rates, providing accurate and reliable results at all times. It accommodates both batch and continuous experiments, offering unparalleled versatility. Furthermore, by utilizing measurement cells with both 2ml and 9ml resolutions, it becomes easy to switch between resolutions to meet specific requirements.

  • Testing Equipment and Devices
  • Measuring Instrument

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Underground Water Flow Sound Measurement Device "GAS-04"

Underground Water Flow Sound Measurement Device "GAS-04"

Comfortably monitor underground water flow sounds with a Wireless Sensor! The location of the waterway can be easily detected.

Underground, there are various sounds such as the flow of groundwater, the friction of gravel, the movement of insects, and the sound of the wind. The "GAS-04" is an underground water flow measurement device that can reduce various noises underground through noise-cut filters and volume adjustment, allowing for the extraction of the sound of underground water flow. Due to the nature of underground water flow increasing near water channels, it is expected to be applied in various cases where identifying the location of water channels and the flow of groundwater is a concern. 【Features】 ■ The measured sound can be digitized and imported into a computer ■ Dustproof, operational from -10°C to 50°C ■ Powered by four AA batteries ■ Simple configuration with a pickup sensor, measurement recorder, and earphones *For more details, please refer to the PDF document or feel free to contact us.

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  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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High-precision, high-speed X-ray crystal orientation measurement device Omega-Theta

High-precision, high-speed X-ray crystal orientation measurement device Omega-Theta

Corresponds to all single crystals - Flagship X-ray Orientation

●High-speed measurement in just 10 seconds ●High precision measurement <0.003°/<0.03° (1σ) ●Equipped with a sample horizontal goniometer ●Crystal orientation, Φ scan, and rocking curve measurement ●Optional extended optical systems such as monochromators ●Wafer orientation check and mapping

  • Analytical Equipment and Devices
  • Measuring Instrument

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Reflectance measurement device

Reflectance measurement device

Reflectance measurement device

This is a spectrophotometer that allows for easy measurement of reflectance. It is an integrated unit with a spectrometer, light source, and fiber, enabling simple and instantaneous measurements without the need for complicated settings or optical axis adjustments. With a light source and CCD/InGaAs detector, it enables high-sensitivity and high-speed measurements of 20 to 100 spectra per second over the range of 250nm to 1700nm.

  • Microscope
  • Measuring Instrument

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Measuring instrument "FLA-200"

Measuring instrument "FLA-200"

Wafer flatness measurement system!

The "FLA-200" is a non-contact flatness and thickness measurement system. It measures the flatness (TTV, BOW, WARP) and thickness of wafer samples. It supports measurements of thickness, TTV, BOW, warp, site flatness, and global flatness (in accordance with ASTM standards), and data output in CSV format is also possible. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Software compatible with 2-D and 3-D mapping display ■ High-precision measurement using a 5mmφ core capacitive probe ■ High-speed measurement of 12,000 points in under 60 seconds *For more details, please contact us or download the catalog.

  • Other measurement and measuring equipment
  • Semiconductors and ICs
  • Measuring Instrument

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Product catalog available: Thermal Gravimetric Analyzer 'Discovery TGA'

Product catalog available: Thermal Gravimetric Analyzer 'Discovery TGA'

With the patented balance system, pure real-time weight data acquisition is now possible!

The "TGA Series" is a thermal gravimetric measurement device that achieves optimal performance without baseline correction or other post-test manipulations. The main components of this product are equipped with the patented "Tru-Mass Balance," which demonstrates excellent performance in weight drift and sensitivity. This series includes the "TGA 5500," which can handle demanding applications, as well as the "TGA 550," which offers advanced options and flexibility in configuration, and the "TGA 55," which exhibits outstanding performance. 【Features】 ■ Extremely low drift balance design accurately detects even slight weight changes ■ Exceptional sensitivity achieved with Tru-Mass balance, regardless of sample size ■ Efficient heat conduction and airflow around the sample ■ Thermally isolated balance with low drift and high sensitivity ■ Provides accurate real-time data *The comprehensive catalog can be downloaded from this page. Individual product catalogs are available only as covers, so if you would like the complete version, please contact our sales representative.

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  • Analytical Equipment and Devices
  • Measuring Instrument

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Tabletop X-ray crystal orientation measurement device SDCOM

Tabletop X-ray crystal orientation measurement device SDCOM

Compact and high-performance Smart X-ray Orientation

●High-speed measurement in just 10 seconds ●Top illumination type ●Various optical system options ●Compatible with ingot and wafer inspection ●Measurement orientation adjustment mechanism

  • Analytical Equipment and Devices
  • Measuring Instrument

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QZSS/GPS antenna module (ultra-compact)

QZSS/GPS antenna module (ultra-compact)

Ultra-small (13 x 15 mm), low power consumption

GPS/QZSS + GLONASS + Galileo + SBAS Antenna Module 【Specifications】 ◆ Model: YIC51513PGMGG-33 ◆ Dimensions: 13 x 15 x 6.8 mm ◆ Internal Memory: FLASH ◆ VCC: 3.3V ◆ PPS ◆ Interface: UART

  • High frequency/microwave parts
  • Measuring Instrument

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Resistance rate / Sheet resistance measuring instrument [NC-10]

Resistance rate / Sheet resistance measuring instrument [NC-10]

Resistance rate / Sheet resistance measuring instrument [NC-10]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Resistance Rate / Sheet Resistance Meter 【EC-80】

Resistance Rate / Sheet Resistance Meter 【EC-80】

Resistance Rate / Sheet Resistance Measuring Instrument 【EC-80】

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Non-contact mobility measurement device "LEI-1610 Series"

Non-contact mobility measurement device "LEI-1610 Series"

Measurement of various semiconductor carrier transport characteristics is possible! Non-contact mobility measurement using microwave reflection!

For the manufacturing of semiconductor devices, carrier mobility is a very important parameter. The "LEI-1610 Series" is a non-contact mobility measurement device capable of measuring various semiconductor carrier transport characteristics such as mobility, carrier concentration, and sheet resistance. Carrier mobility, sheet resistance, and sheet charge density can be measured non-contact and destructively on Si wafers ranging from 2 inches to a maximum of 8 inches, as well as on compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 ■ Non-contact mobility measurement using microwave reflection ■ Standard measurement device for high-frequency device characteristics ■ High correlation with measurement results from the Hall effect ■ Multi-carrier modeling option *For more details, please refer to the related link page or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Non-contact resistance tester "NC-80MAP"

Non-contact resistance tester "NC-80MAP"

Wide-range non-contact (eddy current method) sheet resistance/resistivity multi-point measuring instrument

The "NC-80MAP" is a resistance measuring device that supports a wide range of measurements using multiple types of non-contact probes. The number and type of probes can be changed according to your requirements. It is also capable of multi-point measurements from an edge of 8mm. Additionally, due to its non-contact eddy current method, measurements can be taken without causing any damage. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Semi-auto type ■ Multi-point measurement system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment
  • Measuring Instrument

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Non-contact resistance tester "EC-80"

Non-contact resistance tester "EC-80"

Compact and easy-to-use manual non-contact (eddy current method) resistance meter.

The EC-80 is a simple measuring device that allows for measurements by simply placing a sample between the probes. You can easily switch between resistivity and sheet resistance measurement modes. Additionally, measurement conditions can be easily set using the JOG dial. Since it has fixed probes, you will need to choose one type from several probe types before purchase. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Manual type ■ Single-point measurement system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment
  • Measuring Instrument

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Non-contact sheet resistance measurement device "LEI-1510 Series"

Non-contact sheet resistance measurement device "LEI-1510 Series"

Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.

The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment
  • Measuring Instrument

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Transporter activity measurement device SURFE²R 96SE

Transporter activity measurement device SURFE²R 96SE

Direct measurement of transporter currents in a label-free and real-time manner without using fluorescent probes or radiolabeled ligands.

Currently, the mainstream method for evaluating transporter activity is the uptake assay using RI-labeled substrates. However, there are several issues, such as the need for specialized experimental facilities, complicated waste disposal processes, the fact that the desired substrates are not always commercially available as RI-labeled, and that the endpoint is measured after uptake. The SURFE²R (Surface Electrogenic Event Reader) technology does not require RI labeling, does not need specialized experimental facilities or waste disposal, and allows for real-time evaluation of the activity of transporters (symporters, exchangers, unipoters) and pumps. ■ Direct measurement of transporter currents using Solid Supported Membrane (SSM) ■ Experiments can be conducted using membrane fragments prepared from biological membranes or proteoliposomes reconstituted with the target membrane proteins ■ Simultaneous measurement in 96 wells ■ 10,000 data points per day

  • Other physicochemical equipment
  • Other Analysis
  • Analytical Equipment
  • Measuring Instrument

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Transporter activity measurement device SURFE²R N1

Transporter activity measurement device SURFE²R N1

Direct measurement of transporter currents in a label-free and real-time manner without using fluorescent probes or radiolabeled ligands.

Currently, the mainstream method for evaluating transporter activity is the uptake assay using RI-labeled substrates. However, there are several issues, such as the need for specialized experimental facilities, the complexity of waste liquid treatment, the fact that the desired substrates are not always commercially available as RI-labeled, and the measurement of endpoints after uptake. SURFE²R (Surface Electrogenic Event Reader) technology does not require RI labeling, specialized experimental facilities, or waste liquid treatment, and it allows for real-time evaluation of the activity of transporters (symporters, exchangers, unipoters) and pumps. ■ Direct measurement of transporter currents using Solid Supported Membrane (SSM) ■ Experiments can be conducted using membrane fragments prepared from biological membranes or proteoliposomes reconstituted with the target membrane proteins ■ Light stimulation is possible (optional) ■ An all-in-one device that integrates a dispensing machine, measurement section, and computer ■ 150 data points per day

  • Other physicochemical equipment
  • Other Analysis
  • Analytical Equipment
  • Measuring Instrument

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X-ray Residual Stress Analyzer

X-ray Residual Stress Analyzer

”NEW μ-X360s” The world's lightest and smallest

Portable X-ray Residual Stress Analyzer NEW μ-X360s 【Operability】 ・Easy sample setting,measurement time:Approx.60secs(Ferritic samples) 【Portability】 ・Sensor unit:Approx.2.4kg,Power supply unit:Approx.6.2kg. ・Ideally suited for field measurements. 【Applications】 ・Thermal treatment industrial of products,welding,plastic forming,surface reformation,monitoring and maintenance of plant and infrastructure.

  • X-ray inspection equipment
  • Measuring Instrument

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Portable Gap and Step Measuring Device 'GAPGUN PRO2'

Portable Gap and Step Measuring Device 'GAPGUN PRO2'

An alternative to calipers, step gauges, and radius gauges! This system eliminates variability caused by individuals and enables quality control.

Wouldn't you like to improve dimension measurements for assembly inspections and more, making them easier and faster? "Inspection labor inevitably takes time." "Variability in inspection results occurs depending on the person." "Input errors happen when creating reports." "There are times when there are too many inspection items, making it unclear whether the work was done." The 'GAPGUN' is a portable gap and step measurement tool that uses lasers to measure the 2D cross-section of inspection points non-contact. It combines measurement speed, ease of use, portability, and robustness, allowing for high-precision measurements of steps, gaps, arcs, edge chipping, burrs, seals, angles, and more. Additionally, it navigates the user according to a pre-set inspection plan for the measurement points, and the measurement results are transferred to a PC to generate inspection result reports. 【Features】 ■ Non-contact gap, step, and R measurement tool ■ Fast non-contact measurement ■ A wide range of measurement functions accommodating various shapes ■ Consistent measurement accuracy ■ User-friendly navigation system ☆ Click the link below if you would like to see the list of functions!

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  • Other inspection equipment and devices
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High-precision non-contact thickness measurement device [for semiconductor wafers]

High-precision non-contact thickness measurement device [for semiconductor wafers]

Achieves high-resolution shape measurement. A wide variety of sensor probes are available. Inline measurement of flatness and thickness is also possible. Suitable for wafer inspection applications.

Our company handles non-contact type measuring instruments based on the principles of chromatic aberration confocal and interference. These instruments can be applied to film thickness measurement, shape measurement, roughness measurement, displacement measurement, and appearance inspection, allowing for in-process measurement during manufacturing, high-speed inline inspection, and offline measurement. We offer various interfaces to accommodate embedded applications. Measurements can be performed with high resolution (minimum XY resolution of 1μm and minimum Z resolution of 0.02μm), contributing to improved product quality and reductions in manufacturing process time and costs. 【Features】 ■ Wide range of sensor lineup Sensors can be selected according to inspection requirements and materials from various sensor probes. ■ Sensors according to measurement range Available in single-point sensors, line sensor types, and area scan types. ■ Applications Can be utilized for inspection of PCB flex, wire loop inspection, wafer bump inspection, and more. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

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  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Near-infrared reflectance meter

Near-infrared reflectance meter

Continuous measurement possible in just 3 seconds with high precision! - We will develop an original near-infrared reflectance measuring device.

We will develop and design a reflectance measurement device tailored to the specific near-infrared range according to customer needs. ◆ Wavelengths of selectable LED light sources: 750nm to 1650nm (as of July 2023) ◆ Optical system light transmission and reception method: Unidirectional illumination - integrating sphere reception method or unidirectional transmission and reception method ◆ Measurable reflectance: Total reflectance, specular reflectance, diffuse reflectance, and retroreflectance using beam splitters (half mirrors) ◆ Designable irradiation angle and reception angle: 0° to 80° MAX relative to the normal direction Furthermore, if you wish to measure the reflectance at a specific wavelength not limited to the near-infrared range, we can also manufacture reflectance measurement devices according to your requirements. ● Our self-developed measurement device features a lightweight, compact body with rechargeable capabilities ● Achieves low cost through measurements specifically focused on near-infrared wavelengths ● Capable of measuring the performance of thermal insulation products in just 3 seconds As a product version, we sell the thermal insulation property measurement device [TP-01] with 4 wavelengths.

  • Other inspection equipment and devices
  • Other electronic measuring instruments
  • Measuring Instrument

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Falling Number Measurement Device "Alphatech"

Falling Number Measurement Device "Alphatech"

Easily and safely check for quality deterioration due to sprouting! Simple operation via touch panel.

"AlphaTech" is a falling number measurement system that serves as an indicator of ear sprouting. By understanding the alpha-amylase activity in wheat flour, it allows for easy and safe confirmation of quality degradation due to ear sprouting. This product can measure two samples simultaneously and has achieved space-saving through its compact design. 【Features】 ■ Easy measurement of falling number for anyone ■ Complies with standard measurement methods for agricultural products ■ Measurement completed in about 5 minutes, including sample preparation ■ No reagents or consumables required ■ Excellent visibility with a 4.7-inch large screen *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Inline Near-Infrared Component Measurement Device for Powdered Milk 'ProFoss2'

Inline Near-Infrared Component Measurement Device for Powdered Milk 'ProFoss2'

Standardization processing of the equipment is performed at factory shipment! Achieving seamless relocation operation of the calibration curve.

"ProFoss2" is a milk powder manufacturing support solution that enables monitoring of production by continuously analyzing milk powder samples flowing through the manufacturing line, thereby accelerating and optimizing the adjustment of manufacturing equipment such as spray dryers, and reducing analysis costs. For example, by monitoring the composition (protein, moisture, fat) of skim milk powder and whole milk powder in real-time and with high accuracy, timely adjustments to manufacturing equipment can be made, leading to improved profitability. [Features] ■ Fully automatic inline continuous measurement using near-infrared analysis ■ High-speed measurement through ultra-fast scanning (3 to 15 seconds per measurement) ■ Direct integration of the powder probe into the line, eliminating the need for a bypass line ■ Backup lamp included to minimize downtime ■ Equipped with a 512-pixel InGaAs diode array detector *For more details, please refer to the PDF document or feel free to contact us.

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  • Food Testing/Analysis/Measuring Equipment
  • Measuring Instrument

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Feed Inline Near-Infrared Component Measurement Device "ProFoss2"

Feed Inline Near-Infrared Component Measurement Device "ProFoss2"

No chemical agents used! Improving product consistency leads to a reduction in the necessary adjustments during manufacturing.

"ProFoss2" is a new feed manufacturing support solution that enables monitoring of production, rapid adjustment and optimization of manufacturing equipment, and reduction of analysis costs by continuously analyzing feed flowing through the production line. For example, by monitoring the composition (protein, moisture, fat, fiber, etc.) of feed ingredients, mash feed, pellet feed, fish meal, and more in real-time and accurately, it allows for timely adjustments to manufacturing equipment while reducing raw material costs, thereby improving profitability. 【Features】 ■ Fully automatic inline continuous measurement using near-infrared analysis ■ High-speed measurement with ultra-fast scanning (2-3 seconds per measurement) ■ No bypass line required as the main unit is directly integrated into the line ■ Backup lamp included to minimize downtime ■ Equipped with a 512-pixel InGaAs diode array detector *For more details, please refer to the PDF document or feel free to contact us.

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  • Food Testing/Analysis/Measuring Equipment
  • Measuring Instrument

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Contracted measurement services, high-frequency viscoelasticity, ultrasonic propagation, sound speed, attenuation rate.

Contracted measurement services, high-frequency viscoelasticity, ultrasonic propagation, sound speed, attenuation rate.

You can easily examine viscoelasticity at unprecedented megahertz (MHz) high frequencies.

If you could send a sample, there would be no need for proficiency in measurement or to maintain expensive equipment. Recently, measurement accuracy has improved, allowing for more precise measurements of inkjet inks and similar materials than before. The measurement of megahertz hysteresis loss in liquids such as inks can also be performed similarly to solids. In the high deformation properties of inks for inkjet printers (IJ), which involve high-speed droplet ejection, the Cox-Merz rule, which treats strain rate (1/s) and deformation frequency (rad/s) as equivalent, (https://www.cerij.or.jp/service/05_polymer/rheology_freq-dependence.html) may allow for evaluation. (No freezing occurs even at megahertz) ☆ This was published in the Journal of Applied Physics. "Characterization of Inkjet Ink and Skin Layer Properties by Ultrasonic Viscoelastic Measurement" https://iopscience.iop.org/article/10.35848/1347-4065/adc609/pdf

  • Other contract services
  • Viscometer
  • Measuring Instrument

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Grain milling, whole grains, rapeseed meal component measurement device 'ProFoss2'

Grain milling, whole grains, rapeseed meal component measurement device 'ProFoss2'

High-speed measurement using ultra-fast scanning! Inline near-infrared component measurement device for grain milling, whole grains, and rapeseed meal.

"ProFoss2" is a new grain product manufacturing support solution that enables monitoring of production, rapid adjustment and optimization of manufacturing equipment, and reduction of analysis costs by continuously analyzing grain products flowing through the manufacturing line. For example, by monitoring the composition (protein, moisture, ash, oil content, etc.) of wheat flour, raw wheat, and rapeseed meal in real-time and with high accuracy, timely adjustments to manufacturing equipment can be made, leading to improved profitability. [Features] - Fully automatic inline continuous measurement using near-infrared analysis - High-speed measurement with ultra-fast scanning (2-3 seconds per measurement) - No bypass line required as the main unit is directly integrated into the line - Backup lamp included to minimize downtime - Equipped with a 512-pixel InGaAs diode array detector *For more details, please refer to the PDF document or feel free to contact us.

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  • Food Testing/Analysis/Measuring Equipment
  • Measuring Instrument

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FastGate Inline CV/IV Measurement Device ECV-2500

FastGate Inline CV/IV Measurement Device ECV-2500

FastGate Inline CV/IV Measurement Device

It is a device that can be used inline because it does not require electrode formation, does not damage the wafer, and leaves no contamination.

  • Other inspection equipment and devices
  • Measuring Instrument

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